Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)

Hernández López, Ana María y Aguilar Garib, Juan Antonio y Guillemet Fritsch, Sophie y Nava Quintero, Román Jabir y Dufour, Pascal y Tenailleau, Christophe y Durand, Bernard y Valdez Nava, Zarel (2018) Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT). Materials, 11 (10). pp. 1-14. ISSN 1996-1944

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URL o página oficial: http://doi.org/10.3390/ma11101900

Resumen

Abstract: Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 ◦C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V.

Tipo de elemento: Article
Usuario depositante: Lic. Josimar Pulido
Creadores:
CreadorEmailORCID
Hernández López, Ana MaríaNO ESPECIFICADONO ESPECIFICADO
Aguilar Garib, Juan AntonioNO ESPECIFICADONO ESPECIFICADO
Guillemet Fritsch, SophieNO ESPECIFICADONO ESPECIFICADO
Nava Quintero, Román JabirNO ESPECIFICADONO ESPECIFICADO
Dufour, PascalNO ESPECIFICADONO ESPECIFICADO
Tenailleau, ChristopheNO ESPECIFICADONO ESPECIFICADO
Durand, BernardNO ESPECIFICADONO ESPECIFICADO
Valdez Nava, ZarelNO ESPECIFICADONO ESPECIFICADO
Fecha del depósito: 26 Jul 2019 20:11
Última modificación: 05 Mar 2024 17:23
URI: http://eprints.uanl.mx/id/eprint/15986

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