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Número de elementos: 1.

Yacamán, Miguel José y Santiago, Ulises y Mejía Rosales, Sergio (2015) Aberration-corrected electron microscopy of nanoparticles. In: Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing, Cham, pp. 1-29. ISBN 9783319151779

esta lista se generó en Mon Jan 30 02:51:24 2023 CST.