Aberration-corrected electron microscopy of nanoparticles
Yacamán, Miguel José y Santiago, Ulises y Mejía Rosales, Sergio (2015) Aberration-corrected electron microscopy of nanoparticles. In: Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing, Cham, pp. 1-29. ISBN 9783319151779
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Texto
Aberration-Corrected Electron Microscopy of Nanoparticles.pdf - Versión Aceptada Available under License Creative Commons Attribution Non-commercial No Derivatives. Download (1MB) | Vista previa |
Resumen
The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique
Tipo de elemento: | Sección de libro. | ||||||||||||
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Materias: | Q Ciencia > QC Física | ||||||||||||
Divisiones: | Centro de Investigación en Ciencias Físico Matemáticas | ||||||||||||
Usuario depositante: | Dr. Sergio J. Mejia Rosales | ||||||||||||
Creadores: |
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Fecha del depósito: | 28 Ene 2016 21:52 | ||||||||||||
Última modificación: | 06 Dic 2016 15:38 | ||||||||||||
URI: | http://eprints.uanl.mx/id/eprint/8894 |
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