Aberration-corrected electron microscopy of nanoparticles

Yacamán, Miguel José y Santiago, Ulises y Mejía Rosales, Sergio (2015) Aberration-corrected electron microscopy of nanoparticles. In: Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing, Cham, pp. 1-29. ISBN 9783319151779

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Aberration-Corrected Electron Microscopy of Nanoparticles.pdf - Versión Aceptada
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Resumen

The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique

Tipo de elemento: Sección de libro.
Materias: Q Ciencia > QC Física
Divisiones: Centro de Investigación en Ciencias Físico Matemáticas
Usuario depositante: Dr. Sergio J. Mejia Rosales
Creadores:
CreadorEmailORCID
Yacamán, Miguel JoséNO ESPECIFICADONO ESPECIFICADO
Santiago, UlisesNO ESPECIFICADONO ESPECIFICADO
Mejía Rosales, SergioNO ESPECIFICADONO ESPECIFICADO
Fecha del depósito: 28 Ene 2016 21:52
Última modificación: 06 Dic 2016 15:38
URI: http://eprints.uanl.mx/id/eprint/8894

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